Technical Papers
Perception
Tuesday, 23 July 9:00 AM - 10:30 AM
Session Chair: Diego Gutierrez, Universidad de Zaragoza
Tuesday, 23 July 9:00 AM - 10:30 AM
Session Chair: Diego Gutierrez, Universidad de Zaragoza
A forensic technique for determining if cast and attached shadows in an image are physically consistent. When inconsistencies are detected, the technique provides objective evidence of photo tampering.
Eric Kee
Dartmouth College
James O’Brien
University of California, Berkeley
Hany Farid
Dartmouth College
This first study of material perception in stylized images (specifically painting and cartoon) uses non-photorealistic rendering algorithms to evaluate how such stylization alters the perception of gloss. The study estimates the function that maps realistic gloss parameters to their perception in a stylized rendering.
Adrien Bousseau
INRIA
James P. O'Shea
University of California, Berkeley
Frédo Durand
Massachusetts Institute of Technology CSAIL
Ravi Ramamoorthi
University of California, Berkeley
Maneesh Agrawala
University of California, Berkeley
Street-level image-based rendering maps photographs of façades onto simple geometry, but viewing from an incorrect viewpoint can lead to misperceived geometry. This paper describes rigorous experiments that test competing hypotheses from vision science, develops a predictive model of perceived distortion, and provides guidelines for applications.
Peter Vangorp
REVES/INRIA, Sophia-Antipolis, University of Giessen, Max-Planck-Institut für Informatik
Christian Richardt
REVES/INRIA Sophia-Antipolis
Emily Cooper
University of California, Berkeley
Gaurav Chaurasia
REVES/INRIA Sophia Antipolis
Martin Banks
University of California, Berkeley
George Drettakis
REVES/INRIA Sophia-Antipolis
This generalization of scattering phase-function models demonstrates an expanded translucent appearance space and discovers perceptually meaningful translucency controls by analyzing thousands of images with computation and psychophysics.
Ioannis Gkioulekas
Harvard School of Engineering and Applied Sciences
Bei Xiao
Massachusetts Institute of Technology
Shuang Zhao
Cornell University
Edward H. Adelson
Massachusetts Institute of Technology
Todd Zickler
Harvard School of Engineering and Applied Sciences
Kavita Bala
Cornell University